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Electron mobility and carrier concentration of heteroepitaxial zinc selenide

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.329959· OSTI ID:5691040
The Hall mobility and carrier concentration have been measured on low-resistivity ZnSe epitaxial films in the temperature range of 77--300 K. Both undoped and indium doped materials were studied. Resistivities of the as-grown films varied from 10/sup -1/ to 10/sup 5/ ..cap omega.. cm. Electron mobility was of the order of 10--200 cm/sup 2/ V/sup -1/ s/sup -1/ and was limited by ionized-impurity scattering. Analysis of the temperature dependence of the carrier concentration and Hall mobility indicated that the n-type films were heavily compensated having acceptor concentrations N/sub A/>10/sup 18/ cm/sup -3/. It was found that the acceptor and donor concentrations were essentially independent of Zn/Se pressure ratio present during growth.
Research Organization:
Department of Materials Science and Engineering and Materials Research Center, Northwestern University, Evanston, Illinois 60201
DOE Contract Number:
AC02-79ER10390
OSTI ID:
5691040
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 53:1; ISSN JAPIA
Country of Publication:
United States
Language:
English