X-ray photoelectron spectroscopic studies on yttria, zirconia, and yttria-stabilized zirconia

Journal Article · Mon Jul 15 00:00:00 EDT 1991 · Journal of Applied Physics; (USA)

DOI:https://doi.org/10.1063/1.349611· OSTI ID:5662988

Majumdar, D ^[1]; Chatterjee, D ^[2]

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1. Analytical Technology Division, Manufacturing Research and Engineering, Eastman Kodak Company, Rochester, New York 14650-2132 (US)
2. Ceramics Science Group, Corporate Research Laboratories, Eastman Kodak Company, Rochester, New York 14650-2011 (US)

Surfaces of yttria, zirconia, and yttria-stabilized zirconia were studied using x-ray photoelectron spectroscopy. An almost threefold increase in the surface yttrium concentration was observed in the yttria-stabilized zirconia samples. The core level binding energies of yttrium, zirconium, and oxygen ions in yttria-stabilized zirconia showed chemical shifts. Valence bands and Auger parameters were monitored for the monoclinic and the tetragonal phases of zirconia. Characteristic differences were observed for the two phases due to their different oxygen coordination. The results were used to identify surface phase transitions which were difficult to detect by x-ray diffraction.

• OSTI ID: 5662988
• Journal Information: Journal of Applied Physics; (USA), Journal Name: Journal of Applied Physics; (USA) Vol. 70:2; ISSN 0021-8979; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
BINDING ENERGY
CHALCOGENIDES
CHEMICAL SHIFT
ELECTROMAGNETIC RADIATION
ELECTRON SPECTROSCOPY
ELEMENTS
ENERGY
IONIZING RADIATIONS
METALS
OXIDES
OXYGEN COMPOUNDS
PHASE TRANSFORMATIONS
PHOTOELECTRON SPECTROSCOPY
QUANTITY RATIO
RADIATIONS
SPECTROSCOPY
SURFACE PROPERTIES
TRANSITION ELEMENT COMPOUNDS
TRANSITION ELEMENTS
X RADIATION
YTTRIUM
YTTRIUM COMPOUNDS
YTTRIUM OXIDES
ZIRCONIUM COMPOUNDS
ZIRCONIUM OXIDES