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Title: Error analysis of an underdetermined, spectral unfold problem as applied to an x-ray absorption spectrometer

Conference ·
OSTI ID:5659682

Flash x-ray sources at Sandia National Laboratories routinely test the hardness of electronic components to simulated threat spectra. While it is traditional to calculate the x-ray spectra produced in a given exposure from measurements of free-field dose, current, and voltage, these experimental quantities may not be accurately known for some source geometries. It is appropriate, therefore, to include a direct measurement of the x-ray spectrum for such tests. Random error propagation and unfold accuracy have been studied for the spectral unfold method used in the x-ray absorption spectrometer reported by Carlson. This system of 13 measurements and 30 spectral bins (0.01 -- 8 MeV) is underdetermined; a trial spectrum prevents unphysical solutions. Accuracy of the unfold was tested with simulated data from known spectra; the unfolds agreed with the known spectra to better than 10%, between 0.05 MeV and near the endpoints. Error propagation was studied by perturbing the input data randomly and unfolding the resulting data sets. In each unfold energy bin the standard deviation was taken as the propagated error. Above 0.05 MeV the unfold roughly doubled the input errors. The trail spectrum affects the unfold accuracy more strongly than the propagated errors. 11 refs., 10 figs.

Research Organization:
Sandia National Labs., Albuquerque, NM (USA)
Sponsoring Organization:
USDOE; USDOE, Washington, DC (USA)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
5659682
Report Number(s):
SAND-90-2852C; CONF-910640-3; ON: DE91013508
Resource Relation:
Conference: 8. IEEE pulsed power conference, San Diego, CA (USA), 17-19 Jun 1991
Country of Publication:
United States
Language:
English