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Title: Verification of unfold error estimates in the unfold operator code

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1147713· OSTI ID:451908
;  [1]
  1. Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)

Spectral unfolding is an inverse mathematical operation that attempts to obtain spectral source information from a set of response functions and data measurements. Several unfold algorithms have appeared over the past 30 years; among them is the unfold operator (UFO) code written at Sandia National Laboratories. In addition to an unfolded spectrum, the UFO code also estimates the unfold uncertainty (error) induced by estimated random uncertainties in the data. In UFO the unfold uncertainty is obtained from the error matrix. This built-in estimate has now been compared to error estimates obtained by running the code in a Monte Carlo fashion with prescribed data distributions (Gaussian deviates). In the test problem studied, data were simulated from an arbitrarily chosen blackbody spectrum (10 keV) and a set of overlapping response functions. The data were assumed to have an imprecision of 5{percent} (standard deviation). One hundred random data sets were generated. The built-in estimate of unfold uncertainty agreed with the Monte Carlo estimate to within the statistical resolution of this relatively small sample size (95{percent} confidence level). A possible 10{percent} bias between the two methods was unresolved. The Monte Carlo technique is also useful in underdetermined problems, for which the error matrix method does not apply. UFO has been applied to the diagnosis of low energy x rays emitted by Z-pinch and ion-beam driven hohlraums. {copyright} {ital 1997 American Institute of Physics.}

Research Organization:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
451908
Report Number(s):
CONF-960543-; ISSN 0034-6748; TRN: 97:006265
Journal Information:
Review of Scientific Instruments, Vol. 68, Issue 1; Conference: 11. annual high-temperature plasma diagnostics conference, Monterey, CA (United States), 12-16 May 1996; Other Information: PBD: Jan 1997
Country of Publication:
United States
Language:
English