FeAl underlayers for CoCrPt thin film longitudinal media

Journal Article · Tue Apr 01 00:00:00 EST 1997 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.364824· OSTI ID:565297

Lee, L; Laughlin, D E; Lambeth, D N ^[1]

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1. Data Storage Systems Center, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213 (United States)

B2 ordered FeAl films with a small, uniform grain size have been produced by rf diode sputter deposition on glass substrates. CoCrPt films grown on FeAl underlayers were found to have the (10{bar 1}0) lamellar texture. The in-plane coercivities (H{sub c}) of the CoCrPt/FeAl films are comparable to those of the CoCrPt/Cr films and they can be further improved by inserting a thin Cr intermediate layer between the CoCrPt and the FeAl layers. By employing a MgO seed layer or a (002) textured Cr seed layer, (001) textured FeAl can be obtained. However, the (001) FeAl underlayer only induces a weak (11{bar 2}0) textured CoCrPt. Thus no improvement in H{sub c} over those produced on unseeded FeAl underlayers was observed. {copyright} {ital 1997 American Institute of Physics.}

• DOE Contract Number: FG02-90ER45423
• OSTI ID: 565297
• Report Number(s): CONF-961141-; ISSN 0021-8979; TRN: 9709M0157
• Journal Information: Journal of Applied Physics, Vol. 81, Issue 8; Conference: 41. annual conference on magnetism and magnetic materials, Atlanta, GA (United States), 12-15 Nov 1996; Other Information: PBD: Apr 1997
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
COBALT ALLOYS
MAGNETIC PROPERTIES
CHROMIUM ALLOYS
PLATINUM ALLOYS
CHROMIUM
FERROMAGNETIC MATERIALS
ALUMINIUM ALLOYS
IRON ALLOYS
THIN FILMS
GRAIN SIZE
MICROSTRUCTURE
TEXTURE
COERCIVE FORCE
SPUTTERING
MAGNETIC MOMENTS