Erosion of solid neon by keV electrons
The erosion of solid neon by keV electrons has been studied experimentally and theoretically. Electronic sputtering as well as temperature-enhanced sublimation are investigated by a frequency-change measurement on a quartz crystal or in some cases by the change in intensity of reflected electrons. The erosion yield increases with increasing temperature for substrate temperatures above 7 K. Below this temperature sputtering via electronic transitions is the dominant process. The yield shows a clear minimum for film thicknesses about (5--7) x 10/sup 16/ Ne atoms/cm/sup 2/ for 2-keV electrons. The sputtering yield for thick films has a maximum at 1.2--1.5 keV. The results are explained by the diffusion of excitations to the surface with subsequent decay. From this model and the experimental results one derives a characteristic diffusion length of about 1 x 10/sup 17/ Ne atoms/cm/sup 2/. The eventual particle ejection is driven by decay of surface-trapped excitons or by dissociative recombination. The magnitude of the yield indicates that deexciting neon particles at the surface induce further sputtering. Direct sputtering from electron-nucleus collisions does not contribute significantly to the yield.
- Research Organization:
- Department of Physics, Association EURATOMRis National Laboratory, P.O. Box 49, DK-4000 Roskilde, Denmark
- OSTI ID:
- 5648312
- Journal Information:
- Phys. Rev. B: Condens. Matter; (United States), Journal Name: Phys. Rev. B: Condens. Matter; (United States) Vol. 34:1; ISSN PRBMD
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
Molecular & Chemical Physics-- Beams & their Reactions
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
COLLECTIVE EXCITATIONS
COLLISIONS
DIFFUSION
ELECTRON COLLISIONS
ELEMENTS
ENERGY RANGE
ENERGY-LEVEL TRANSITIONS
EROSION
EVAPORATION
EXCITATION
EXCITONS
FILMS
FLUIDS
GASES
KEV RANGE
NEON
NONMETALS
PHASE TRANSFORMATIONS
QUASI PARTICLES
RARE GASES
RECOMBINATION
SOLIDS
SPUTTERING
SUBLIMATION
TEMPERATURE DEPENDENCE
ULTRALOW TEMPERATURE