An x-ray spectrometer for Compton scattering

Journal Article · Wed Jan 01 04:00:00 EST 1992 · Review of Scientific Instruments; (United States)

DOI:https://doi.org/10.1063/1.1143079· OSTI ID:5646583

Sakurai, Y; Ito, M; Urai, T; Tanaka, Y; Sakai, N ^[1]; Iwazumi, T; Kawata, H; Ando, M ^[2]; Shiotani, N ^[3]

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1. The Institute of Physical Chemical Research (RIKEN), Wako, Saitama 351-01 (Japan)
2. Photon Factory, National Laboratory for High Energy Physics, Tsukuba, Ibaraki 305 (Japan)
3. Tokyo University of Fisheries, Minato, Tokyo 108 (Japan)

An x-ray spectrometer has been designed and constructed for Compton scattering measurements using 40--70 keV x-rays from an ellipsoid multipole wiggler (EMPW) installed in the accumulation ring of the National Laboratory for High Energy Physics at Tsukuba. The spectrometer has four sets of a Cauchois-type energy analyzer and an imaging plate, which are arranged on the surface of a cone and share a scattering angle of 160{degree}. In each energy-analyzing system, to increase signal to noise ratio a set of vertical and horizontal slits are inserted between the analyzer and the imaging plate. A resolution of 0.13 a.u. in terms of electron momentum was achieved. A Compton profile of a vanadium single crystal was measured with an integrated counting rate of 400 counts/s.

• OSTI ID: 5646583
• Journal Information: Review of Scientific Instruments; (United States), Journal Name: Review of Scientific Instruments; (United States) Vol. 63:1; ISSN RSINA; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
430303* -- Particle Accelerators-- Experimental Facilities & Equipment
BASIC INTERACTIONS
COMPTON EFFECT
DESIGN
ELASTIC SCATTERING
ELECTRICAL EQUIPMENT
ELECTROMAGNETIC INTERACTIONS
ELECTROMAGNETS
EQUIPMENT
INTERACTIONS
MAGNETS
MEASURING INSTRUMENTS
RADIATION SOURCES
SCATTERING
SPECTROMETERS
SYNCHROTRON RADIATION SOURCES
WIGGLER MAGNETS
X-RAY SPECTROMETERS