Cauchois-type Compton Spectrometer Using X-ray Image Intensifier

Journal Article · Wed May 12 04:00:00 EDT 2004 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.1757941· OSTI ID:20653100

Itou, M; Sakurai, Y ^[1]

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1. Japan Synchrotron Radiation Research Institute (JASRI), SPring-8, 1-1-1 Kouto, Mikazuki, Sayo, Hyogo 679-5198 (Japan)

A new setup of the Cauchois-type x-ray spectrometer for Compton scattering experiments at SPring-8 is described. The new setup employs an x-ray image intensifier (X-II) as a position sensitive detector (PSD). The X-II can detect a single photon, which leads to improvements in both background reduction and effective spatial resolution. As a demonstration, we have measured Compton profiles of niobium with a momentum resolution of 0.15 atomic units. It was found that the data-acquisition efficiency increases by 20 times compared to the previous quasi-PSD system. Anisotropies in the experimental Compton profiles are in good agreement with those in the band-theoretical predictions.

• OSTI ID: 20653100
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 705; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ANISOTROPY
COMPTON EFFECT
COMPTON SPECTROMETERS
DATA ACQUISITION
EFFICIENCY
FLUORESCENCE
FORECASTING
IMAGE INTENSIFIERS
IMAGE PROCESSING
NIOBIUM
PHOTONS
POSITION SENSITIVE DETECTORS
SPATIAL RESOLUTION
SPRING-8 STORAGE RING
SYNCHROTRON RADIATION
X RADIATION
X-RAY SPECTROMETERS