Time-resolved hard x-ray studies using third-generation synchrotron radiation sources (abstract)

Journal Article · Wed Jan 01 04:00:00 EST 1992 · Review of Scientific Instruments; (United States)

DOI:https://doi.org/10.1063/1.1143116· OSTI ID:5646306

Mills, D M ^[1]

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1. Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439 (United States)

The third-generation, high-brilliance, synchrotron radiation sources currently under construction will usher in a new era of x-ray research in the physical, chemical, and biological sciences. One of the most exciting areas of experimentation will be the extension of static x-ray scattering and diffraction techniques to the study of transient or time-evolving systems. The high repetition rate, short-pulse duration, high-brilliance, variable spectral bandwidth, and large particle beam energies of these sources make them ideal for hard x-ray, time-resolved studies. The primary focus of this presentation will be on the novel instrumentation required for time-resolved studies such as optics which can increase the flux on the sample or disperse the x-ray beam, detectors and electronics for parallel data collection, and methods for altering the natural time structure of the radiation. This work is supported by the U.S. Department of Energy, BES-Materials Science, under Contract No. W-31-109-ENG-38.

• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 5646306
• Journal Information: Review of Scientific Instruments; (United States), Journal Name: Review of Scientific Instruments; (United States) Vol. 63:1; ISSN RSINA; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
430303* -- Particle Accelerators-- Experimental Facilities & Equipment
440101 -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COHERENT SCATTERING
DIFFRACTION
DIFFRACTOMETERS
EXPERIMENT PLANNING
MEASURING INSTRUMENTS
MONOCHROMATORS
PLANNING
RADIATION SOURCES
RESOLUTION
SCATTERING
SYNCHROTRON RADIATION SOURCES
TIME RESOLUTION
TIMING PROPERTIES
X-RAY DIFFRACTION
X-RAY DIFFRACTOMETERS