Time-resolved materials science opportunities using synchrotron x-ray sources

Conference · Thu Jun 01 04:00:00 EDT 1995

OSTI ID:102263

Larson, B C; Tischler, J Z ^[1]

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1. Oak Ridge National Lab., TN (United States). Solid State Div.

The high brightness, high intensity, and pulsed time-structure of synchrotron sources provide new opportunities for time-resolved x-ray diffraction investigations. With third generation synchrotron sources coming on line, high brilliance and high brightness are now available in x-ray beams with the highest flux. In addition to the high average flux, the instantaneous flux available in synchrotron beams is greatly enhanced by the pulsed time structure, which consists of short bursts of x-rays that are separated by {approximately}tens to hundreds of nanoseconds. Time-resolved one- and two-dimensional position sensitive detection techniques that take advantage of synchrotron radiation for materials science x-ray diffraction investigations are presented, and time resolved materials science applications are discussed in terms of recent diffraction and spectroscopy results and materials research opportunities.

• Research Organization: Oak Ridge National Lab., TN (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 102263
• Report Number(s): CONF-9507161--1; ON: DE95017449
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
MATERIALS
MOESSBAUER EFFECT
POSITION SENSITIVE DETECTORS
RADIATION FLUX
RESEARCH PROGRAMS
SEMICONDUCTOR DEVICES
SOLID STATE PHYSICS
SYNCHROTRON RADIATION SOURCES
THIN FILMS
USES
X-RAY DIFFRACTION
X-RAY SPECTROSCOPY