XUV preionization effects in high power magnetically insulated diodes

Conference · Tue Jan 01 04:00:00 EST 1985

OSTI ID:5641213

Maenchen, J; Woodworth, J R; Foltz, B W; Burns, E J.T.; Seidel, D B; Dorrell, L R; Johnson, P R; Reyes, P; Torres, G; Williams, G

Electrode surface desorption and photoionization by an intense XUV pulse has been shown to dramatically improve a vacuum diode impedance history. The 6-Terawatt Applied-B ion diode experiment on PBFA I is limited by a delay in both diode and ion current initiation. The insulation magnetic field impedes electron crossings which are believed to aid the ion source initiation. The diode is therefore initially a severe overmatch to the accelerator 40-nsec, 2.2-MV, 0.5-ohm pulse. The diode current increases during the pulse, leading to a rapidly falling impedance history. The application of an intense (30 to 50-kW/cm/sup 2/) XUV flux from an array of sixteen 60-kA spark sources is found to cause immediate diode current flow, resulting in both a greatly improved impedance history and the prompt initiation of an intense higher power ion beam.

• Research Organization: Sandia National Labs., Albuquerque, NM (USA)
• DOE Contract Number: AC04-76DP00789
• OSTI ID: 5641213
• Report Number(s): SAND-84-2447C; CONF-850616-33; ON: DE85013142
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
700208* -- Fusion Power Plant Technology-- Inertial Confinement Technology
ACCELERATORS
DESORPTION
DIODE TUBES
ELECTRODES
ELECTROMAGNETIC RADIATION
ELECTRON TUBES
IMPEDANCE
IONIZATION
PARTICLE BEAM FUSION ACCELERATOR
PHOTOIONIZATION
RADIATIONS
ULTRAVIOLET RADIATION