Changes in the microhardness of SiC (6H) samples in neutron irradiation
Journal Article
·
· Sov. At. Energy (Engl. Transl.); (United States)
OSTI ID:5632209
The authors study the microhardness of SiC (6H) crystals irradiated with reactor neutrons to a flux of 1.10/sup 17/-1.10/sup 21/ cm/sup -2/. The crystals were deformed by indentation on a PMT-3 microhardness tester provided with an attachment for the automatic movement of the indenter. As a result of neutron irradiation, the microhardness of SiC (6H) increased 1.6 times while at the same time the lattice parameter increased by about 1%. The microhardness of irradiated SiH (6H) decreases upon annealing at a temperature greater than or equal to 1000-1600 degrees C because the concentration of radiation-induced defects decreases; this is confirmed by measurements of the electrical properties.
- OSTI ID:
- 5632209
- Journal Information:
- Sov. At. Energy (Engl. Transl.); (United States), Journal Name: Sov. At. Energy (Engl. Transl.); (United States) Vol. 59:3; ISSN SATEA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360203 -- Ceramics
Cermets
& Refractories-- Mechanical Properties
360206* -- Ceramics
Cermets
& Refractories-- Radiation Effects
ANNEALING
CARBIDES
CARBON COMPOUNDS
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
HARDENING
HARDNESS
HEAT TREATMENTS
IRRADIATION
LATTICE PARAMETERS
MATERIALS
MATERIALS TESTING
MECHANICAL PROPERTIES
MECHANICAL TESTS
MICROHARDNESS
N-TYPE CONDUCTORS
NEUTRON FLUENCE
NEUTRON FLUX
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION FLUX
RADIATION HARDENING
SEMICONDUCTOR MATERIALS
SILICON CARBIDES
SILICON COMPOUNDS
STRESS ANALYSIS
TEMPERATURE EFFECTS
TESTING
360203 -- Ceramics
Cermets
& Refractories-- Mechanical Properties
360206* -- Ceramics
Cermets
& Refractories-- Radiation Effects
ANNEALING
CARBIDES
CARBON COMPOUNDS
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
HARDENING
HARDNESS
HEAT TREATMENTS
IRRADIATION
LATTICE PARAMETERS
MATERIALS
MATERIALS TESTING
MECHANICAL PROPERTIES
MECHANICAL TESTS
MICROHARDNESS
N-TYPE CONDUCTORS
NEUTRON FLUENCE
NEUTRON FLUX
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION FLUX
RADIATION HARDENING
SEMICONDUCTOR MATERIALS
SILICON CARBIDES
SILICON COMPOUNDS
STRESS ANALYSIS
TEMPERATURE EFFECTS
TESTING