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Novel studies in x-ray emission analysis using radioisotopes

Thesis/Dissertation ·
OSTI ID:5630743
Two novel techniques employing radioisotopes for x-ray emission were studied: internal x-ray emission analysis and low energy proton activation with counting of radioactive x-ray emitters. An inexpensive, sensitive technique for the analysis of a broad range of elements (Z 16 through 47 were studied) was developed by implanting radioisotopes (/sup 3/H, /sup 35/S, /sup 63/Ni, /sup 75/Se, /sup 91/Tc, /sup 125/I, /sup 195/Au) into a sample. These radioisotopes decay by x-ray or ..beta../sup -/ emission which in turn excites characteristic x-rays from elements in the sample. The application of this technique to trace analysis was demonstrated with a multielement standard sample containing 0.1% of Ag, Ni, Cr, Zn, Co, Rb, Sc, Br, Mo, and As. Limits of detection varied with the radioisotope and its specific activity. Low energy proton radioactivation (3.6-6 MeV) with subsequent nondispersive x-ray counting was evaluated for trace analysis. Thick target yields and interference-free detection limits were measured for 15 isotopes. This technique was applied for the determination of V and Ga in NBS glasses doped at the 500 and 50 ppm level. Elemental mapping was accomplished by autoradiography. Data from a Ga doped Si semiconductor sample irradiated with 5 MeV protons showed a spatial resolution of 50-100 ..mu..m, with an ultimate limit of 3-10 ..mu..m.
Research Organization:
Texas A and M Univ., College Station (USA)
OSTI ID:
5630743
Country of Publication:
United States
Language:
English

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