3D {ital XY} and Lowest Landau Level Fluctuations in Deoxygenated YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} Thin Films
Journal Article
·
· Physical Review Letters
- Physics Department, Purdue University, West Lafayette, Indiana 47907-1396 (United States)
Conductivity measurements reflect vortex solid melting in YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} films. Field-independent glass exponents {nu}{sub g}{approx_equal}1.9 and z{sub g}{approx_equal}4.0 describe the transition T{sub g}(H) for 0{lt}H{le}26T. At low fields, 3D XY exponents {nu}{sub XY}{approx_equal}0.63 and z{sub XY}{approx_equal}1.25 are also observed, with z{sub XY} smaller than expected. These compete with glass scaling according to multicritical theory. A predicted power-law form of T{sub g}(H) is observed for 0.5T{sub c}{lt}T{sub g}{lt}T{sub c}. For T{sub g}{lt}0.5T{sub c}, 3D XY scaling fails, but a self-consistent lowest Landau level analysis becomes possible, obtaining T{sub c2}(H) with positive curvature. {copyright} {ital 1997} {ital The American Physical Society}
- Research Organization:
- Purdue Research Foundation
- DOE Contract Number:
- FG02-90ER45427
- OSTI ID:
- 561619
- Journal Information:
- Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 16 Vol. 78; ISSN 0031-9007; ISSN PRLTAO
- Country of Publication:
- United States
- Language:
- English
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