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Three-dimensional {ital XY} scaling of the resistivity of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} single crystals

Journal Article · · Physical Review, B: Condensed Matter
; ;  [1];  [2]
  1. Department of Physics, University of Leeds, Leeds LS29JT (United Kingdom)
  2. Department of Physics and Materials Research Laboratory, University of Illinois, West Green Street, Urbana, Illinois 61801 (United States)

The electrical resistivity of a single-crystal sample of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} has been measured. The results are consistent with the existence of a critical regime governed by three-dimensional {ital XY} critical exponents. Evidence is also found for the divergence of the conductivity along a line {ital H}{sub {ital g}}({ital T}){proportional_to}(1{minus}{ital T}/{ital T}{sub {ital c}}){sup 2{nu}}, the vortex glass transition line. The vortex glass exponents characteristic of this line are {ital z}{sub {ital g}}({nu}{sub {ital g}}{minus}1){approx}5{plus_minus}1. The results are not consistent with the lowest Landau-level scaling.

OSTI ID:
44561
Journal Information:
Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 17 Vol. 51; ISSN 0163-1829; ISSN PRBMDO
Country of Publication:
United States
Language:
English

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