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Steady-state carrier escape from single quantum wells

Journal Article · · IEEE Journal of Quantum Electronics (Institute of Electrical and Electronics Engineers); (United States)
DOI:https://doi.org/10.1109/3.234396· OSTI ID:5615048
; ;  [1]; ;  [2]
  1. Blackett Lab., London (United Kingdom)
  2. Univ. of Sheffield, Sheffield (United Kingdom)

The mechanics for carrier escape from quantum wells (QW's) are of fundamental importance to the understanding of high-speed high-power devices such as SEED's or devices which demand high carrier escape efficiencies, such as QW solar cells. Here, the authors have studied the variation in dc photocurrent with bias and temperature from GaAs-Al[sub x]Ga[sub 1[minus]x]As single quantum wells embedded in p-i-n diodes, and they find that the observed temperature response shows Arrhenius behavior with a field-dependent activation energy close to the hole well depth. This can be accounted for using a model based on the competition between photocarrier escape and recombination. Using reasonable values for the diode's built-in voltage and the quantum-well recombination lifetime they achieve good quantitative agreement between theory and experiment if they assume that the recombination rate is governed by the fastest escaping carriers which are light holes in their devices.

OSTI ID:
5615048
Journal Information:
IEEE Journal of Quantum Electronics (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Journal of Quantum Electronics (Institute of Electrical and Electronics Engineers); (United States) Vol. 29:6; ISSN 0018-9197; ISSN IEJQA7
Country of Publication:
United States
Language:
English