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Destruction of the Josephson effect by fluctuation

Journal Article · · J. Low Temp. Phys.; (United States)
DOI:https://doi.org/10.1007/BF00683333· OSTI ID:5614140

The authors use the fluctuation-dissipation theorem to calculate the fluctuation energy and the associated free energy both when the junction is phase-correlated and when it is uncorrelated. In these calculations, they use the resistively-shunted-junction model to describe the junction. By comparing the excess free energy in the correlated state (over the uncorrelated one) with the Josephson coupling energy, they find a thermodynamic criterion for destruction of the Josephson characteristic of the junction. In the limiting case where the shunt resistance has a finite zero-temperature limit, they find a nearly universal resistance threshold. In another limit, where the resistance is taken to be the frequency-independent tunneling resistance of the Bogoliubov quasiparticles (in a semiconductor picture), their criterion reduces to that of Anderson when the temperature T = 0. They predict that for some junction parameters, the system can be reentrant, while for some other values, the transition temperature may be lowered.

Research Organization:
Technion-Israel Institute of Technology, Haifa, Israel
OSTI ID:
5614140
Journal Information:
J. Low Temp. Phys.; (United States), Journal Name: J. Low Temp. Phys.; (United States) Vol. 69:5-6; ISSN JLTPA
Country of Publication:
United States
Language:
English