Electron-impact ionization of Mg-like ions: S/sup 4 +/, Cl/sup 5 +/, and Ar/sup 6 +/

Journal Article · Sun Jun 01 00:00:00 EDT 1986 · Phys. Rev. A; (United States)

DOI:https://doi.org/10.1103/PhysRevA.33.3779· OSTI ID:5611488

Howald, A M; Gregory, D C; Meyer, F W; Phaneuf, R A; Mueller, A; Djuric, N; Dunn, G H

Absolute electron-impact ionization cross sections were measured as a function of collision energy for ions in the Mg-isoelectronic sequence S/sup 4 +/, Cl/sup 5 +/, and Ar/sup 6 +/. The measurements cover the energy range from threshold to 1500 eV and show onsets due to the indirect ionization process of inner-shell excitation followed by autoionization. The relative magnitude of the indirect ionization process increases dramatically in comparison with the direct process along the sequence, a feature which is also emphasized by earlier data for Al/sup +/.

• Research Organization: Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 5611488
• Journal Information: Phys. Rev. A; (United States), Journal Name: Phys. Rev. A; (United States) Vol. 33:6; ISSN PLRAA
• Country of Publication: United States
• Language: English

Related Subjects

640304* -- Atomic
Molecular & Chemical Physics-- Collision Phenomena
74 ATOMIC AND MOLECULAR PHYSICS
ARGON IONS
AUTOIONIZATION
BEAMS
CHARGED PARTICLES
CHLORINE IONS
COLLIDING BEAMS
COLLISIONS
CROSS SECTIONS
ELECTRON COLLISIONS
ELECTRON-ION COLLISIONS
ENERGY-LEVEL TRANSITIONS
EXCITATION
ION COLLISIONS
IONIZATION
IONS
MULTICHARGED IONS
SULFUR IONS