PIXE as an analytical tool: An external-beam system in helium and the role of sample preparation

Conference · Wed Apr 01 00:00:00 EST 1981 · IEEE Trans. Nucl. Sci.; (United States)

OSTI ID:5597245

Williams, E T; Finston, H L

A PIXE system in which samples in a helium-filled target chamber are irradiated by an external proton beam is described. The system is well suited for study of a wide range of materials, some merely calling for qualitative analysis, and others requiring quantitative measurements. This variety mandates a flexible approach to sample preparation in order to obtain full sensitivity of the system. Some examples taken from our work are given.

• Research Organization: City University of New York, Brooklyn College, Brooklyn, New York 11210
• DOE Contract Number: AC02-76ER03126
• OSTI ID: 5597245
• Report Number(s): CONF-801111-; TRN: 84-001491
• Journal Information: IEEE Trans. Nucl. Sci.; (United States), Vol. NS-28:2; Conference: 6. conference on application of accelerators in research and industry, Denton, TX, USA, 3 Nov 1980
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
HELIUM
PIXE ANALYSIS
SAMPLE PREPARATION
CORALS
PROTON BEAMS
SEA BED
SEDIMENTS
BEAMS
CHEMICAL ANALYSIS
CNIDARIA
ELEMENTS
FLUIDS
GASES
NONDESTRUCTIVE ANALYSIS
NONMETALS
NUCLEON BEAMS
PARTICLE BEAMS
RARE GASES
X-RAY EMISSION ANALYSIS
400103* - Radiometric & Radiochemical Procedures- (-1987)