Regional PIXE facility at Chandigarh (India) and Trace Element Analysis of Aerosol and Bio-medical Samples

Journal Article · Tue Mar 10 04:00:00 EDT 2009 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3120030· OSTI ID:21289534

Govil, I M ^[1]

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1. Department of Physics, Panjab University, Chandigarh 160014 (India)

A regional Proton induced X-ray Emission (PIXE) facility is newly developed using 3 Mev Proton beam from Variable Energy Cyclotron, Panjab University, Chandigarh (India). A new target chamber has been designed to cater for Proton Induced Gamma Emission (PIGE) and Rutherford Back Scattering (RBS) along with PIXE measurements. The HPGe x-ray detector, the Ge (Li) gamma-ray detector and a silicon surface barrier (SSB) detector can be mounted simultaneously in the chamber for this purpose. A remotely controlled stepper motor is provided to move the target wheel holding 12/24 samples at a time. This facility is now routinely used for the detection of trace elements in the aerosol, medical and forensic science samples. The paper presents the analysis of Aerosol samples collected from highly polluted steel city of Mandi Govindgarh in Punjab state and relatively clean city of Jammu in Jammu and Kashmir region. The results from the analysis of these samples show some basic differences in the trace element profile of the two cities. The paper also describes the trace element analysis of fly ash in the vicinity of Ropar Thermal Power plant in Punjab. The scope of this study was to determine the concentration and composition of atmospheric particulate matter (PM) in the vicinity of coal-fired thermal power plants in India. The data taken for the Bio-medical samples are also discussed.

• OSTI ID: 21289534
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1099; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
AEROSOLS
BACKSCATTERING
COAL
FLY ASH
GE SEMICONDUCTOR DETECTORS
INDIA
ION MICROPROBE ANALYSIS
MEV RANGE
MULTI-ELEMENT ANALYSIS
PIXE ANALYSIS
QUANTITATIVE CHEMICAL ANALYSIS
RUTHERFORD BACKSCATTERING SPECTROSCOPY
SI SEMICONDUCTOR DETECTORS
SILICON
TARGET CHAMBERS
TRACE AMOUNTS
URBAN AREAS
VARIABLE ENERGY CYCLOTRONS