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Title: High-resolution threshold photoionization of N sub 2 O

Journal Article · · Journal of Chemical Physics; (USA)
DOI:https://doi.org/10.1063/1.461080· OSTI ID:5594856
;  [1]; ;  [2]
  1. Department of Chemistry, Purdue University, West Lafayette, Indiana 47907-3699 (USA)
  2. Chemistry Department, Brookhaven National Laboratory, Upton, New York 11973 (USA)

Pulsed field ionization (PFI) has been used in conjunction with a coherent vuv source to obtain high-resolution threshold photoelectron spectra for the (000), (010), (020), and (100) vibrational states of the N{sub 2}O{sup +} cation. Simulations for the rotational profiles of each vibronic level were obtained by fitting the Buckingham--Orr--Sichel equations (A. D. Buckingham, B. J. Orr, and J. M. Sichel, Philos. Trans. R. Soc. London, Ser. A {bold 268}, 147 (1970)) using accurate spectroscopic constants for the ground states of the neutral and the ion. The relative branch intensities are interpreted in terms of the partial waves of the outgoing photoelectron to which the ionic core is coupled and in terms of the angular momentum transferred to the core. The PFI technique also allows us to report an improved value for the ionization potential of N{sub 2}O of 103 963{plus minus}5 cm{sup {minus}1}.

DOE Contract Number:
AC02-76CH00016
OSTI ID:
5594856
Journal Information:
Journal of Chemical Physics; (USA), Vol. 95:2; ISSN 0021-9606
Country of Publication:
United States
Language:
English