Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Deuterium trapping in helium-implanted nickel

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.331133· OSTI ID:5585572

By means of ion-beam-analysis techniques, the trapping of deuterium implanted into nickel preimplanted with helium was investigated in the temperature range 100--500 K. Following room-temperature helium implantations and deuterium implantations at approx.100 K, linear-ramp annealing (1--2 K/min) was carried out, while the deuterium concentration within the near-surface region (0--0.5 ..mu..m) was monitored by use of the nuclear reaction D(/sup 3/He,..cap alpha..)/sup 1/ H. The release curves were analyzed by solving a diffusion equation with the appropriate trapping terms. In addition to trapping by lattice defects, stronger helium-associated traps were found with a binding enthalpy of 0.55 +- 0.05 eV relative to a solution site. We propose that the responsible entities are small helium bubbles observed in the implanted material by transmission electron microscopy.

Research Organization:
Institute of Physics, University of Aarhus, DK-8000 Aarhus C, Denmark
OSTI ID:
5585572
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 53:5; ISSN JAPIA
Country of Publication:
United States
Language:
English