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U.S. Department of Energy
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Laser processing of polycrystalline silicon solar cells

Technical Report ·
OSTI ID:5579326

In the formation of p-n junctions in polycrystalline solar cells, any conventional high-temperature treatment will cause adverse effects either because of dopant diffusion along the grain boundaries which may cause shorting of the junction, or because of contamination by undesired impurities. Recently, we have demonstrated that ion implantation and pulsed-laser annealing can be used to produce well-controlled dopant regions in polycrystalline Si. Because of the short duration of the laser radiation and because the near-surface region of the samples melt, grain boundary diffusion and segregation can be eliminated. Solar cells fabricated from cast polycrystalline Si by this technique have resulted in open circuit voltages as high as 560 mv and efficiencies as high as 11.6%.

Research Organization:
Oak Ridge National Lab., TN (USA)
DOE Contract Number:
W-7405-ENG-26
OSTI ID:
5579326
Report Number(s):
CONF-791112-55
Country of Publication:
United States
Language:
English