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Monitoring interfacial dynamics by pulsed laser techniques: Annual report

Technical Report ·
DOI:https://doi.org/10.2172/5573402· OSTI ID:5573402
Several types of materials have been surveyed including thin film and layered semiconductors as well as a metal and semimetal. Second harmonic (SH) generation measurements on these materials were made using both nanosecond (Q-switched) and picosecond (mode-locked) pulsed Nd:YAG lasers with appropriate gated or photon counting detection. Initial studies were performed under steady state conditions in order to optimize the experiments for time-resolved studies. SHG were also extended to the time domain. A means of monitoring surface structure and reconstruction phenomena in-situ was developed. This discovery now opens a broad new area of dynamic interfacial measurements to be done in-situ.
Research Organization:
Oregon Univ., Eugene (USA)
DOE Contract Number:
FG06-86ER45273
OSTI ID:
5573402
Report Number(s):
DOE/ER/45273-1; ON: DE88003362
Country of Publication:
United States
Language:
English