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U.S. Department of Energy
Office of Scientific and Technical Information

(Monitoring interfacial dynamics by pulsed laser techniques)

Technical Report ·
OSTI ID:5466898
The current work in the area of time resolved interfacial kinetics has centered on both semiconductor and metal electrode surfaces. The semiconductor studies have involved measurement of luminescence from the GsAs/liquid interface. The metal electrode studies have monitored thin film growth by second harmonic generation (SHG) during electrodeposition. The progress we have made over the past year is described in this report.
Research Organization:
Oregon Univ., Eugene, OR (United States)
Sponsoring Organization:
DOE; USDOE, Washington, DC (United States)
DOE Contract Number:
FG06-86ER45273
OSTI ID:
5466898
Report Number(s):
DOE/ER/45273-5; ON: DE91016950
Country of Publication:
United States
Language:
English