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Title: Investigation of matrix effects on the neutral fractions ejected from ion-bombarded, uranium-containing solids using resonance ionization mass spectrometry

Technical Report ·
OSTI ID:5572500

Resonance ionization mass spectrometry (RIMS) has been used to investigate matrix effects on the yields of U, UO, and UO/sub 2/ neutrals desorbed from ion-bombarded, uranium-containing solids. The yield of corresponding secondary ions was also examined by secondary ion mass spectrometry (SIMS). Samples studied were uranium metal, UO/sub 2/ (polycrystalline and single crystal), and U/sub 3/O/sub 8/. Results indicate that the ratio of atomic neutrals to ions in the sputtered plume is quite sensitive to sample composition and surface contamination. The ratio of ground-state U atoms to ions (U/sup 0//U/sup +/) for Ar/sup +/ sputtering from a clean U metal surface is estimated as 2.8 x 10/sup 3/ and the corresponding ratio for UO/sub 2/ as 6.2 x 10/sup 1/. 1 ref., 1 fig., 2 tabs.

Research Organization:
Oak Ridge National Lab., TN (USA)
DOE Contract Number:
AC05-84OR21400
OSTI ID:
5572500
Report Number(s):
DOE/OR/21400-T323; ON: DE88000594; TRN: 88-002929
Resource Relation:
Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English