Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Characterization of bilayer-metal contacts to high T sub c superconducting films

Journal Article · · Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (USA)
DOI:https://doi.org/10.1116/1.577419· OSTI ID:5562225
; ; ;  [1]; ;  [2]
  1. Microelectronics Sciences Labs and Center for Telecommunications Research, Columbia University, New York, New York 10027 (USA)
  2. Bell Communications Research, Red Bank, New Jersey 07701 (USA)
Low resistivity normal metal contacts to YBa{sub 2}Cu{sub 3}O{sub 7{minus}{ital x}} (YBCO) films have been investigated. It has previously shown that the contact resistivity of Au contact exhibits a strong temperature dependence, decreasing 2--3 orders of magnitude at a transition temperature near {ital T}{sub {ital c}} of YBCO film. Other metal contacts, including Pd and Nb, do not show this effect. The contact resistivity of metal contacts has been correlated with interfacial reactions and disruption studied by x-ray photoelectron spectroscopy (XPS). In this work we demonstrate that a thin interlayer, specifically 10 A of Au, between the YBCO and a metal contact such as Nb can allow the formation of a low resistance contact. XPS of the effect of the interlayer is presented, and the implications for carrier coupling are discussed. These results indicate a methodology for low contact resistance bilayer-metal structures for supercondcuting device applications.
OSTI ID:
5562225
Journal Information:
Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (USA), Journal Name: Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (USA) Vol. 9:3; ISSN 0734-2101; ISSN JVTAD
Country of Publication:
United States
Language:
English