CMOS ASIC (application specific integrated circuit)

Technical Report · Sat Jul 01 04:00:00 EDT 1989

DOI:https://doi.org/10.2172/5551185· OSTI ID:5551185

Nuckolls, L. R.

This paper discusses the following topics: semicustom integrated circuits; radiation effects and hardness; circuit design considerations; the design cycle; fault analysis and design for test; and circuit layout.

• Research Organization: Sandia National Labs., Albuquerque, NM (USA)
• Sponsoring Organization: DOE/DP
• DOE Contract Number: AC04-76DP00789
• OSTI ID: 5551185
• Report Number(s): SAND-89-2158; ON: DE90001866
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
420800* -- Engineering-- Electronic Circuits & Devices-- (-1989)
COMPUTER ARCHITECTURE
DESIGN
DOCUMENT TYPES
ELECTRONIC CIRCUITS
HARDNESS
INTEGRATED CIRCUITS
LOGIC CIRCUITS
MANUALS
MECHANICAL PROPERTIES
MICROELECTRONIC CIRCUITS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS