Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

An algorithm for enforcement of contact constraints in quasistatic applications using matrix-free solution algorithms

Technical Report ·
DOI:https://doi.org/10.2172/554827· OSTI ID:554827
 [1]
  1. Sandia National Labs., Albuquerque, NM (United States). Engineering Mechanics and Material Modeling Dept.

A contact enforcement algorithm has been developed for matrix-free quasistatic finite element techniques. Matrix-free (iterative) solution algorithms such as nonlinear Conjugate Gradients (CG) and Dynamic Relaxation (DR) are distinctive in that the number of iterations required for convergence is typically of the same order as the number of degrees of freedom of the model. From iteration to iteration the contact normal and tangential forces vary significantly making contact constraint satisfaction tenuous. Furthermore, global determination and enforcement of the contact constraints every iteration could be questioned on the grounds of efficiency. This work addresses this situation by introducing an intermediate iteration for treating the active gap constraint and at the same time exactly (kinematically) enforcing the linearized gap rate constraint for both frictionless and frictional response.

Research Organization:
Sandia National Labs., Albuquerque, NM (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
554827
Report Number(s):
SAND--97-2629; ON: DE98001090; BR: DP0102052
Country of Publication:
United States
Language:
English

Similar Records

Mechanical contact by constraints and split-based preconditioning
Technical Report · Fri Feb 28 23:00:00 EST 2014 · OSTI ID:1134842

A matrix analysis of conjugate gradient algorithms
Conference · Wed Mar 31 23:00:00 EST 1993 · OSTI ID:10193408

Comparison between ML-EM and WLS-CG algorithms for SPECT image reconstruction
Journal Article · Sat Nov 30 23:00:00 EST 1991 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) · OSTI ID:5745622