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Decay kinetics of the ultraviolet and visible luminescences emitted by electron-irradiated crystalline H/sub 2/O ice

Journal Article · · J. Chem. Phys.; (United States)
OSTI ID:5532234
Electron pulse irradiated samples of high purity, crystalline H/sub 2/O ice at 88 K showed three kinetically distinguishable regions of luminescence emission at 280--340 nm (band I); 320--600 nm (band II); and 450--600 nm (band III). Band II emission was assigned to the A-italic /sup 2/summation/sup +/..-->..X-italic /sup 2/Pi transition of OH, the gas phase peak being shifted from 306.4 to --385 nm by the ice lattice. The decay half-life of the band II emission resulting from a single, --0.05 Mrad electron pulse, was 25 +- 3 ns and increased steeply to 210 +- 10 ns for the second pulse and then steadily decreased to 140 +- 10 ns after 20 pulses. Band II emission from the second or later pulses was resolved into a short lived component with a decay half-life of --30 ns and a longer lived component with a half-life of --400 ns. The latter decay fitted a second order homogeneous rate equation in which the initial concentrations of the two reactants were in the ratio (2.6 +- 0.1):1 and was attributed to the formation of excited OH by electron--ion recombination in the bulk ice. The short lived band II emission was also attributed to excited OH and probably arose from a mixture of a fast intraspur recombination reaction with some other process of different reaction order. Dose accumulation (memory) effects were attributed to the accumulation of OH radicals and lattice vacancies in the irradiated ice. The band III emission had a half-life of 25 +- 5 ns and its decay kinetics were consistent with emission from species such as excited OH/sup -/ or H/sub 3/O produced when electrons tunnel from a trapping site to a geminate partner.
Research Organization:
School of Mathematical and Physical Sciences, Murdoch University, Murdoch, Western Australia, 6150, Australia
OSTI ID:
5532234
Journal Information:
J. Chem. Phys.; (United States), Journal Name: J. Chem. Phys.; (United States) Vol. 85:5; ISSN JCPSA
Country of Publication:
United States
Language:
English