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Title: Low temperature flux creep in high- Tc superconductors

Conference ·
OSTI ID:5531718
; ;  [1]; ;  [2];  [3]
  1. Argonne National Lab., IL (USA)
  2. AN SSSR, Moscow (USSR). Inst. Teoreticheskoj Fiziki
  3. Argonne National Lab., IL (USA) Alberta Univ., Edmonton, AB (Canada). Dept. of Physics

An exact solution describing flux creep in high-T{sub c} superconductors at low temperatures was found, assuming the creep activation barrier U grows logarithmically with decreasing current j: U = U{sub 0} ln(j{sub 0}/j). The magnetic relaxation of single crystal Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub 8} was measured at moderate temperatures and magnetic fields. Two different regimes corresponding to the partial and full penetration of the magnetic field into the sample were found. The observed magnetic relaxation behavior is in a good agreement with the model proposed. 19 refs., 4 figs.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE; USDOE, Washington, DC (USA)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
5531718
Report Number(s):
ANL/CP-73508; CONF-9105151-9; ON: DE91015193
Resource Relation:
Conference: Physical phenomena at high magnetic fields, Tallahassee, FL (USA), 15-18 May 1991
Country of Publication:
United States
Language:
English