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Title: Exact solution for flux creep with logarithmic U ( j ) dependence: Self-organized critical state in high- T sub c superconductors

Journal Article · · Physical Review Letters; (United States)
 [1]; ;  [2]
  1. Materials Science Division, Argonne National Laboratory, Argonne, Illinois (USA)
  2. Landau Institute for Theoretical Physics, Moscow (USSR)

An exact solution describing flux creep in high-{ital T}{sub {ital c}} superconductors is found, assuming the creep activation barrier {ital U} grows logarithmically with decreasing current {ital j}: {ital U}={ital U}{sub 0} ln({ital j}{sub 0}/{ital j}). For incomplete flux penetration, the flux density {ital B} is a function of the single variable {xi}={ital x}/{ital t}{sup 1/({sigma}+2)}, {sigma}={ital U}{sub 0}/{ital T}, and the system considered exhibits self-organized criticality. In a fully penetrated sample, {ital B} depends separately upon {ital x} and {ital t}. A sharp transition between these regimes occurs when the flux fronts from opposite sides of the sample meet, resulting in a kink in the magnetization relaxation curve.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
5419937
Journal Information:
Physical Review Letters; (United States), Vol. 67:7; ISSN 0031-9007
Country of Publication:
United States
Language:
English