The uses of synchrotron radiation sources for elemental and chemical microanalysis

Conference · Tue Aug 01 04:00:00 EDT 1989

OSTI ID:5520849

Chen, J R; Chao, E C.T.; Minkin, J A; Back, J M; Jones, K W; Rivers, M L; Sutton, S R ^[1]

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1. State Univ. of New York, Geneseo, NY (USA)

Synchrotron radiation sources offer important features for the analysis of a material. Among these features is the ability to determine both the elemental composition of the material and the chemical state of its elements. For microscopic analysis synchrotron x-ray fluorescence (SXRF) microprobes now offer spatial resolutions of 10{mu}m with minimum detection limits in the 1--10 ppM range depending on the nature of the sample and the synchrotron source used. This paper describes the properties of synchrotron radiation and their importance for elemental analysis, existing synchrotron facilities and those under construction that are optimum for SXRF microanalysis, and a number of applications including the high energy excitation of the K lines of heavy elements, microtomography, and XANES and EXAFS spectroscopies. 45 refs., 8 figs., 1 tab.

• Research Organization: Brookhaven National Lab., Upton, NY (USA)
• Sponsoring Organization: DOE/ER; NSF; SUNY; USGS
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 5520849
• Report Number(s): BNL-43250; CONF-8908165--1; ON: DE90001269
• Country of Publication: United States
• Language: English

Related Subjects

440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
656003 -- Condensed Matter Physics-- Interactions between Beams & Condensed Matter-- (1987-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CHEMICAL ANALYSIS
COMPUTERIZED TOMOGRAPHY
DIAGNOSTIC TECHNIQUES
INCIDENCE ANGLE
PROBES
RADIATION SOURCES
SYNCHROTRON RADIATION SOURCES
TOMOGRAPHY
USES