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Title: X-ray area detector based on CCD readout for diffraction study (abstract)

Journal Article · · Review of Scientific Instruments; (United States)
DOI:https://doi.org/10.1063/1.1142682· OSTI ID:5520103
; ; ;  [1]
  1. Photon Factory, National Laboratory for High Energy Physics Oho, Tsukuba, Ibaraki 305 (Japan)

An x-ray area detector based on charged coupled device (CCD) readout has been designed and constructed for diffraction studies. Incident x-rays are converted to visible photons by a phosphor screen (Y{sub 2}O{sub 2}S or CsI(Na)) which is attached via fiber optic to the input surface of the demagnifying image intensifier with a 4:1 demagnification. The intensified visible image created on the output phosphor screen of the image intensifier is viewed through a 1:1 optical lens system by the cooled CCD (Thomson:THX31156) which has 1024{times}1024 pixels (pixel size: 19 {mu}m{times}19 {mu}m). The detector system should have the following characteristics: active area: 100 mm in diameter, spatial resolution: 0.1 mm{times}0.1 mm, detective quantum efficiency (DQE): about 70% for 8 keV, dynamic range: more than 10{sup 4}, readout time: 4 s. Nonuniformity of response due to the image intensifier is corrected by software. The CCD is cooled to {minus}30{degree} to {minus}40{degree} to reduce the dark current. The background noise level of the detector system corresponds to less than 10 x-ray photons per pixel. Detailed hardware and software configuration and measured performance of the system will be described. The system will be applied to small-angle x-ray scattering (SAXS) and protein crystallography.

OSTI ID:
5520103
Journal Information:
Review of Scientific Instruments; (United States), Vol. 63:1; ISSN 0034-6748
Country of Publication:
United States
Language:
English