Study on the micelle formation of surfactants in aqueous solutions under high pressure by laser light-scattering technique. Part 1

Journal Article · Tue Apr 01 04:00:00 EST 1980 · J. Colloid Interface Sci.; (United States)

DOI:https://doi.org/10.1016/0021-9797(80)90216-7· OSTI ID:5503262

Nishikido, N; Shinozaki, M; Sugihara, G; Tanaka, M; Kaneshina, S

An apparatus was assembled to enable direct observation and measurement of the variation of micellar aggregation number with pressure in surfactant in aqueous solutions. The apparatus comprises a laser light-scattering design. The apparatus was used to determine pressure dependence of micellar aggregation number, charge, and concentration of representative ionic surfactant (sodium dodecyl sulfate (SDS)) in the aqueous solution. Additionally, the aggregation number and concentration of micelle of nonionic surfactant, hexaoxyethylene dodecyl ether were studied under pressure as a simple model for the pressure-induced denaturation of globular protein. The conclusion is that the size-minimizing effect of dehydration in terms of hydrophobic bonding and size-decreasing effect in terms of hydrogen bonding allow no distinct minimum in the aggregation number vs. pressure curve to be found for the nonionic surfactant, whereas the aggregation number of SDS micelle vs. pressure curve exhibited a clear minimum. 18 references.

• OSTI ID: 5503262
• Journal Information: J. Colloid Interface Sci.; (United States), Journal Name: J. Colloid Interface Sci.; (United States) Vol. 74:2; ISSN JCISA
• Country of Publication: United States
• Language: English

Related Subjects

02 PETROLEUM
020300* -- Petroleum-- Drilling & Production
AGGLOMERATION
ALKALI METAL COMPOUNDS
CRYSTAL STRUCTURE
DISPLACEMENT FLUIDS
ELECTROMAGNETIC RADIATION
ETHERS
FLUIDS
LASER RADIATION
LIGHT SCATTERING
MICELLAR SYSTEMS
MICROSTRUCTURE
ORGANIC COMPOUNDS
ORGANIC OXYGEN COMPOUNDS
OXYGEN COMPOUNDS
PRESSURE DEPENDENCE
RADIATIONS
SCATTERING
SODIUM COMPOUNDS
SODIUM SULFATES
SULFATES
SULFUR COMPOUNDS
SURFACTANTS
SYNTHESIS