Determination of surface atomic layer of RBa{sub 2}Cu{sub 3}O{sub y} thin films and SrTiO{sub 3} (001) single crystal by glancing incidence-exit X-ray diffuse scattering

Conference · Tue Dec 31 04:00:00 EST 1996

OSTI ID:549857

Liu, Ziyuan; Ogota, Seiya; Morishita, Tadataka ^[1]

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1. Superconductivity Research Lab., Tokyo (Japan)

The surface atomic layer of c-axis oriented RBa{sub 2}Cu{sub 3}O{sub y} (R = Nd, Y) thin films deposited by laser ablation process and SrTiO{sub 3} (001) single crystal has been studied by using the method of glancing incidence-exit x-ray diffuse scattering(GIEXS). Utilizing the GIEXS, the authors have correctly identified the topmost layer of SrTiO{sub 3} (001) single crystal with a well defined surface terminating layer. It demonstrated the effectiveness of GIEXS to distinguish the surface atomic layer from their underlying layered bulk crystal. The observations on the RBa{sub 2}Cu{sub 3}O{sub y} thin films using GIEXS proved that the surface of NdBa{sub 2}Cu{sub 3}O{sub y} thin films is predominantly terminated with a CuO chain plan, while a different layer cover4ed the surface of YBa{sub 2}Cu{sub 3}O{sub y} thin films. The results on the surface of SrTiO{sub 3} (001) single crystal indicated that the surface termination layer of SrTiO{sub 3} treated by the chemical method was TiO{sub 2} plane, while the annealed SrTiO{sub 3} surface was mainly terminated with TiO{sub 2} plane with a small portion covered by SrO plane.

• Sponsoring Organization: New Energy and Industrial Technology Development Organization, Tokyo (Japan)
• OSTI ID: 549857
• Report Number(s): CONF-960163--; ISBN 0-8194-2070-0
• Country of Publication: United States
• Language: English

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