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Film properties of CVD titanium nitride deposited with organometallic precursors at low pressure using inert gases, ammonia, or remote activation

Journal Article · · Journal of the Electrochemical Society; (United States)
DOI:https://doi.org/10.1149/1.2221013· OSTI ID:5489383
;  [1];  [2]
  1. Siemens AG, Munich (Germany). Semiconductor Group
  2. Technical Univ. Munich (Germany). Semiconductor Physics

Chemical vapor deposited (CVD)-TiN layers are required as interdiffusion barriers for the fabrication of microelectronic devices. The deposition of CVD-TiN from a metallorganic precursor, tetrakis-(dimethylamido)-titanium (IV),Ti[N(CH[sub 3])[sub 2]][sub 4] has been investigated and compared using three different experimental approaches: the thermal decomposition of the precursor, its thermal reaction with ammonia, and its reaction with H[sub 2]/N[sub 2] mixtures which have been activated in a remote microwave plasma (2.46 GHz). The experiments have been carried out at moderate temperatures of 250--500 C and pressures between 0.5 and 5 Torr. Mass spectrometric analysis of the effluent gases have been performed and reaction mechanisms for the different experimental conditions are postulated based on these investigations. The application of remote plasma activated H[sub 2]/N[sub 2] mixtures instead of ammonia is a major breakthrough in controlling the reactivity of the chemical partners and is proposed to be also used during CVD-TiN formation from TiCl[sub 4].

OSTI ID:
5489383
Journal Information:
Journal of the Electrochemical Society; (United States), Journal Name: Journal of the Electrochemical Society; (United States) Vol. 140:11; ISSN 0013-4651; ISSN JESOAN
Country of Publication:
United States
Language:
English