Laser-induced forward transfer: A new approach for the deposition of high T sub c superconducting thin films
Journal Article
·
· Journal of Materials Research; (USA)
- Centre de Recherches Nucleaires (IN2P3), Laboratoire Phase (ER du CNRS n 292), 23 rue du Loess, F-67037 Strasbourg Cedex, France (FR)
- Groupe de Physique des Solides de l'ENS, Universite Paris VII, 2 Place Jussieu, F-75251 Paris Cedex 05, France
We propose in this work a new approach, named laser-induced forward transfer, for the rapid deposition and patterning in a clean environment of high {ital T}{sub {ital c}} superconducting thin films. A stoichiometric high {ital T}{sub {ital c}} compound is initially deposited in a thin layer on an optically transparent support by laser evaporation or another more conventional technique. By irradiating under vacuum or in air the precoated layer with a strongly absorbed single laser pulse through the transparent support, we are able to remove the film from its support to be transferred onto a selected target substrate, held in contact to the original film. Using this technique, we have successfully transferred with one single pulse, provided by an excimer or a Nd:YAG laser, YBaCuO and BiSrCaCuO precoated thin films on various substrates. The Rutherford backscattering spectrometry experiments do not show any strong modification in the composition of the transferred layer against the source material, and the superconducting phases for the two types of compounds were obtained after subsequent thermal annealing carried out in a furnace around 850--900 {degree}C in O{sub 2}. For the BiSrCaCuO films transferred onto MgO, substrates we have measured an onset critical temperature of about 90 K with a zero resistance at 80 K.
- OSTI ID:
- 5486988
- Journal Information:
- Journal of Materials Research; (USA), Journal Name: Journal of Materials Research; (USA) Vol. 4:5; ISSN JMREE; ISSN 0884-2914
- Country of Publication:
- United States
- Language:
- English
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Journal Article
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OSTI ID:6000272
Related Subjects
36 MATERIALS SCIENCE
360201* -- Ceramics
Cermets
& Refractories-- Preparation & Fabrication
360202 -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
360204 -- Ceramics
Cermets
& Refractories-- Physical Properties
ABSORPTION SPECTRA
ALKALINE EARTH METAL COMPOUNDS
BARIUM COMPOUNDS
BARIUM OXIDES
BISMUTH COMPOUNDS
BISMUTH OXIDES
CALCIUM COMPOUNDS
CALCIUM OXIDES
CHALCOGENIDES
COPPER COMPOUNDS
COPPER OXIDES
DEPOSITION
ELASTIC SCATTERING
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRON MICROSCOPY
ELEMENTS
EXCIMER LASERS
FILMS
GAS LASERS
LASERS
MICROSCOPY
MINERALS
NEODYMIUM LASERS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
PULSES
QUARTZ
RUTHERFORD SCATTERING
SCANNING ELECTRON MICROSCOPY
SCATTERING
SEMIMETALS
SILICA
SILICON
SILICON COMPOUNDS
SILICON OXIDES
SOLID STATE LASERS
SPECTRA
STRONTIUM COMPOUNDS
STRONTIUM OXIDES
SUPERCONDUCTING FILMS
TRANSITION ELEMENT COMPOUNDS
USES
YTTRIUM COMPOUNDS
YTTRIUM OXIDES
360201* -- Ceramics
Cermets
& Refractories-- Preparation & Fabrication
360202 -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
360204 -- Ceramics
Cermets
& Refractories-- Physical Properties
ABSORPTION SPECTRA
ALKALINE EARTH METAL COMPOUNDS
BARIUM COMPOUNDS
BARIUM OXIDES
BISMUTH COMPOUNDS
BISMUTH OXIDES
CALCIUM COMPOUNDS
CALCIUM OXIDES
CHALCOGENIDES
COPPER COMPOUNDS
COPPER OXIDES
DEPOSITION
ELASTIC SCATTERING
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRON MICROSCOPY
ELEMENTS
EXCIMER LASERS
FILMS
GAS LASERS
LASERS
MICROSCOPY
MINERALS
NEODYMIUM LASERS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
PULSES
QUARTZ
RUTHERFORD SCATTERING
SCANNING ELECTRON MICROSCOPY
SCATTERING
SEMIMETALS
SILICA
SILICON
SILICON COMPOUNDS
SILICON OXIDES
SOLID STATE LASERS
SPECTRA
STRONTIUM COMPOUNDS
STRONTIUM OXIDES
SUPERCONDUCTING FILMS
TRANSITION ELEMENT COMPOUNDS
USES
YTTRIUM COMPOUNDS
YTTRIUM OXIDES