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Microstructure and superconducting properties of Y--Ba--Cu--O and Yb--Ba--Cu--O thin films formed by metalorganic deposition

Journal Article · · Journal of Materials Research; (USA)
; ; ;  [1]
  1. General Motors Research Laboratories, Warren, Michigan 48090-9055 (US)
Thin films of Y--Ba--Cu--O and Yb--Ba--Cu--O, 0.5--1.5 {mu}m in thickness, were deposited onto {l angle}211{r angle} and {l angle}100{r angle} SrTiO{sub 3} single crystal substrates by metalorganic deposition (MOD). After deposition the samples were annealed by conventional furnace annealing or rapid thermal annealing (RTA). The microstructures of these films were then characterized by x-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), and energy-dispersive x-ray spectrometry (EDS). Grain size of the annealed films varied from 0.25 to 1.0 {mu}m. Improved superconducting properties were found for the RTA samples, compared to furnace annealing, and were attributed to larger grain size, little strontium diffusion into the thin films from the substrate, and highly preferred orientation of the 1:2:3 phase.
OSTI ID:
5486733
Journal Information:
Journal of Materials Research; (USA), Journal Name: Journal of Materials Research; (USA) Vol. 4:5; ISSN JMREE; ISSN 0884-2914
Country of Publication:
United States
Language:
English