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Gamma and neutron irradiation tests on commercial IC op amps

Conference ·
OSTI ID:5485168
; ;
Experimental results of gamma and neutron irradiation tests on 30 types of integrated-circuit operational amplifiers from 11 manufacturers are presented. All units were low-cost, commercial-grade devices. Op amps were evaluated for changes in offset voltage, input bias current, power supply current, open-loop gain, gain-bandwidth product, slew rate, power-supply and common-mode rejection ratios. Bipolar transistor op amps with resistive collector load resistors for the input stage indicated the best radiation hardness.
Research Organization:
Oak Ridge National Lab., TN (USA); Tennessee Univ., Knoxville (USA). Dept. of Electrical Engineering; Hewlett-Packard Co., Corvallis, OR (USA)
DOE Contract Number:
AC05-84OR21400
OSTI ID:
5485168
Report Number(s):
CONF-850711-12; ON: DE85015660
Country of Publication:
United States
Language:
English

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Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
AMPLIFIERS
BARYONS
DOSES
ELECTROMAGNETIC RADIATION
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
ELEMENTARY PARTICLES
EQUIPMENT
FERMIONS
GAMMA RADIATION
HADRONS
HOT CELLS
INTEGRATED CIRCUITS
IONIZING RADIATIONS
IRRADIATION
LABORATORY EQUIPMENT
MICROELECTRONIC CIRCUITS
NEUTRONS
NUCLEONS
OPERATIONAL AMPLIFIERS
PHYSICAL RADIATION EFFECTS
RADIATION DOSES
RADIATION EFFECTS
RADIATIONS