Atomic resolution with the atomic force microscope on conductors and nonconductors

Journal Article · Tue Mar 01 04:00:00 EST 1988 · J. Vac. Sci. Technol., A; (United States)

DOI:https://doi.org/10.1116/1.575441· OSTI ID:5484921

Albrecht, T R; Quate, C F

The atomic force microscope (AFM) has achieved atomic resolution on nonconducting as well as electrically conducting surfaces, opening a new class of materials to atomically resolved surface imaging. Images of boron nitride (a nonconductor) reveal that AFM can distinguish different atomic species. AFM images of molybdenum disulfide and graphite are also presented. Graphite AFM images appear identical to images obtained by scanning tunneling microscopy (STM), although AFM and STM probably respond to different atomic sites on the graphite surface. Microfabrication procedures for constructing low-mass force-sensing cantilevers are discussed.

• Research Organization: Department of Applied Physics, Stanford University, Stanford, California 94305
• OSTI ID: 5484921
• Journal Information: J. Vac. Sci. Technol., A; (United States), Journal Name: J. Vac. Sci. Technol., A; (United States) Vol. 6:2; ISSN JVTAD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
360602 -- Other Materials-- Structure & Phase Studies
BORON COMPOUNDS
BORON NITRIDES
CARBON
CHALCOGENIDES
ELEMENTAL MINERALS
ELEMENTS
GRAPHITE
MICROSCOPY
MINERALS
MOLYBDENUM COMPOUNDS
MOLYBDENUM SULFIDES
NITRIDES
NITROGEN COMPOUNDS
NONMETALS
PNICTIDES
REFRACTORY METAL COMPOUNDS
SULFIDES
SULFUR COMPOUNDS
SURFACES
TOPOGRAPHY
TRANSITION ELEMENT COMPOUNDS