Scanning Photoelectron Microscope (SPEM) with a zone plate generated microprobe
Conference
·
OSTI ID:5480457
- State Univ. of New York, Stony Brook, NY (USA). Dept. of Physics
We describe instrumentation of a scanning photoelectron microscope (SPEM), which we are presently developing and commissioning at the X1A beamline of the National Synchrotron Light Source (NSLS). This instrument is designed to use the Soft X-ray Undulator (SXU) at the NSLS as a high brightness source to illuminate a Fresnel zone plate, thus forming a finely focused probe, {le} 0.2{mu}m in size, on the specimen surface. A grating monochromator selects the photon energy in the 400-800 eV range with an energy resolution better than 1 eV. The expected flux in the focus is in the 5 {times} 10{sup 7} {minus} 10{sup 9} photons/s range. A single pass Cylindrical Mirror Analyzer (CMA) is used to record photoemission spectra, or to form an image within a fixed electron energy bandwidth as the specimen is mechanically scanned. As a first test, a 1000 mesh Au grid was successfully imaged with Au 4 f primary photoelectrons, achieving a resolution of about 1{mu}m. 10 refs., 5 figs., 1 tab.
- Research Organization:
- Brookhaven National Lab., Upton, NY (USA)
- Sponsoring Organization:
- DOE/ER; NSF
- DOE Contract Number:
- AC02-76CH00016; AC03-76SF00098
- OSTI ID:
- 5480457
- Report Number(s):
- BNL-43339; CONF-890802--11; ON: DE90001552
- Country of Publication:
- United States
- Language:
- English
Similar Records
A scanning photoelectron microscope (SPEM) at the National Synchrotron Light Source (NSLS)
Images of a microelectronic device with the X1-SPEM, a first generation scanning photoemission microscope at the National Synchrotron Light Source
Development of a second generation scanning photoemission microscope with a zone plate generated microprobe at the National Synchrotron Light Source
Conference
·
Sat Dec 31 23:00:00 EST 1988
·
OSTI ID:5480483
Images of a microelectronic device with the X1-SPEM, a first generation scanning photoemission microscope at the National Synchrotron Light Source
Journal Article
·
Wed May 01 00:00:00 EDT 1991
· Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (USA)
·
OSTI ID:5677383
Development of a second generation scanning photoemission microscope with a zone plate generated microprobe at the National Synchrotron Light Source
Journal Article
·
Tue Jan 31 23:00:00 EST 1995
· Review of Scientific Instruments; (United States)
·
OSTI ID:6599730
Related Subjects
43 PARTICLE ACCELERATORS
430303 -- Particle Accelerators-- Experimental Facilities & Equipment
440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
ACCELERATORS
CYCLIC ACCELERATORS
ELECTROMAGNETIC RADIATION
ELECTRON MICROSCOPES
ELECTRON MICROSCOPY
EMISSION
ENERGY RESOLUTION
IONIZING RADIATIONS
MICROSCOPES
MICROSCOPY
NSLS
PHOTOEMISSION
RADIATION SOURCES
RADIATIONS
RESOLUTION
SCANNING ELECTRON MICROSCOPY
SECONDARY EMISSION
SOFT X RADIATION
SPECIFICATIONS
SYNCHROTRON RADIATION SOURCES
SYNCHROTRONS
X RADIATION
430303 -- Particle Accelerators-- Experimental Facilities & Equipment
440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
ACCELERATORS
CYCLIC ACCELERATORS
ELECTROMAGNETIC RADIATION
ELECTRON MICROSCOPES
ELECTRON MICROSCOPY
EMISSION
ENERGY RESOLUTION
IONIZING RADIATIONS
MICROSCOPES
MICROSCOPY
NSLS
PHOTOEMISSION
RADIATION SOURCES
RADIATIONS
RESOLUTION
SCANNING ELECTRON MICROSCOPY
SECONDARY EMISSION
SOFT X RADIATION
SPECIFICATIONS
SYNCHROTRON RADIATION SOURCES
SYNCHROTRONS
X RADIATION