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Energy straggling of helium ions in aluminum

Conference · · IEEE Trans. Nucl. Sci.; (United States)
OSTI ID:5474474

Straggling of /sup 3/He/sup +/ ions in thin films of Al has been measured in the energy range 1.1 - 2.3 MeV. The energy straggling was obtained by taking the backscattering spectra of incident ions first from a clean Ta backing, then from an identical Ta backing onto which a thin Al film has been evaporated. The straggling values were compared with predictions of various theories. The results calculated by Bohr and Lindhard-Scharff theories are respectively 15% and 30% lower than our experimental measurements, whereas those are in good agreement with the Bethe-Livingston theory.

Research Organization:
Center des Sciences et de La Technologie Nucleaires, R.P. 1017, Alger
OSTI ID:
5474474
Report Number(s):
CONF-801111-
Journal Information:
IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. NS-28:2; ISSN IETNA
Country of Publication:
United States
Language:
English