Energy straggling for medium-energy H sup + beams penetrating Cu, Ag, and Pt

Journal Article · Thu Aug 01 00:00:00 EDT 1991 · Physical Review A. General Physics; (United States)

DOI:https://doi.org/10.1103/PhysRevA.44.1759· OSTI ID:5374564

Kido, Y ^[1]; Koshikawa, T ^[2]

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1. Department of Physics, Ritsumeikan University, Toji-in, Kita-ku, Kyoto 603, Japan (JP)
2. Osaka Electro-Communication University, Hatsu-cho, Neyagawa, Osaka 572, Japan (JP)

The electronic-energy-straggling values for 50--250-keV H{sup +} beams penetrating Cu, Ag, and Pt have been measured using backscattering. The Cu, Ag, and Pt layers with a thickness of about 30 nm were deposited onto Si, SiO{sub 2}, Al{sub 2}O{sub 3}, and ZrO{sub 2} substrates with electron beams or by sputtering. The uniformity and grain growth of the thin films were observed by cross-section transmission electron microscopy (TEM) and diffraction. The thickness fluctuation determined by TEM is less than 2 nm. The backscattering spectra were obtained with an electrostatic toroidal analyzer with an energy resolution (standard deviation) of 150--200 eV, and the computer-simulated spectrum analysis has given the best-fit values of the energy straggling. The derived straggling values are compared with the theoretical values calculated from the extended Lindhard-Winther theory using the local electron density of the Hartree-Fock-Slater atomic model. Discussion is also made in terms of the short-range correlation effect proposed by Sigmund (Phys. Rev. A 26, 2497 (1982)).

• OSTI ID: 5374564
• Journal Information: Physical Review A. General Physics; (United States), Vol. 44:3; ISSN 1050-2947
• Country of Publication: United States
• Language: English

Related Subjects

73 NUCLEAR PHYSICS AND RADIATION PHYSICS
COPPER
ION-ATOM COLLISIONS
BACKSCATTERING
PLATINUM
PROTONS
SILVER
ALUMINIUM OXIDES
ENERGY LOSSES
EXPERIMENTAL DATA
KEV RANGE
KEV RANGE 10-100
KEV RANGE 100-1000
METALS
SILICON OXIDES
SPUTTERING
STATISTICS
STOPPING POWER
SUBSTRATES
TRANSMISSION ELECTRON MICROSCOPY
ZIRCONIUM OXIDES
ALUMINIUM COMPOUNDS
ATOM COLLISIONS
BARYONS
CHALCOGENIDES
COLLISIONS
DATA
ELECTRON MICROSCOPY
ELEMENTARY PARTICLES
ELEMENTS
ENERGY RANGE
FERMIONS
HADRONS
INFORMATION
ION COLLISIONS
LOSSES
MATHEMATICS
MICROSCOPY
NUCLEONS
NUMERICAL DATA
OXIDES
OXYGEN COMPOUNDS
PLATINUM METALS
SCATTERING
SILICON COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
TRANSITION ELEMENTS
ZIRCONIUM COMPOUNDS
654001* - Radiation & Shielding Physics- Radiation Physics
Shielding Calculations & Experiments