Properties of the one- and two-component electron-hole liquid in stressed Si at T=0

Journal Article · Tue Apr 15 04:00:00 EST 1980 · Phys. Rev., B: Condens. Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.21.3597· OSTI ID:5469419

Kirczenow, G; Singwi, K S

We present a calculation of the T=0 properties of the two-component electron-hole liquid (EHL) in <001>-stressed Si, of the EHL in the equilibrium limit in <001>-stressed Si, and of the EHL in <111>-stressed Si. We conclude that a phase separation of the two-component EHL such as that which we have predicted to occur in <111>-stressed Ge is much less likely to occur in <001>-stressed Si. We also discuss the available experimental data for <111>-stressed Si and <001>-stressed Si in the equilibrium limit.

• Research Organization: Department of Physics and Astronomy, Northwestern University, Evanston, Illinois 60201
• OSTI ID: 5469419
• Journal Information: Phys. Rev., B: Condens. Matter; (United States), Journal Name: Phys. Rev., B: Condens. Matter; (United States) Vol. 21:8; ISSN PRBMD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360603* -- Materials-- Properties
656000 -- Condensed Matter Physics
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSOLUTE ZERO TEMPERATURE
ELECTRON-HOLE DROPLETS
ELECTRONS
ELEMENTARY PARTICLES
ELEMENTS
EXCITONS
FERMIONS
HOLES
LEPTONS
PHASE TRANSFORMATIONS
PLASMA
QUASI PARTICLES
SEMIMETALS
SILICON
SOLID-STATE PLASMA
STRESS ANALYSIS