Critical-state flux penetration and linear microwave vortex response in YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} films
Journal Article
·
· Physical Review, B: Condensed Matter
- Physics Department, Northeastern University, Boston, Massachusetts 02115 (United States)
- Rome Laboratory, Hanscom AFB, Bedford, Massachusetts 01731 (United States)
The vortex contribution to the dc magnetic field (H) dependence of the microwave surface impedance {tilde Z}{sub s}(H)=R{sub s}(H)+iX{sub s}(H) of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} thin films was measured using suspended patterned resonators. {tilde Z}{sub s}(H) is shown to be a direct measure of the flux density B(H) enabling a very precise test of models of flux penetration. Three regimes of field-dependent behavior were observed: (1) Initial flux penetration occurs on very low-field scales H{sub i}(4.2K){approximately}10mT, (2) at moderate fields the flux penetration into the virgin state is in excellent agreement with calculations based upon the {ital field-induced} Bean critical state for thin-film geometry, parametrized by a field scale H{sub s}(4.2K){approximately}J{sub c}d{approximately}0.5T, and (3) for very high fields H{gt}H{sub s}, the flux density is uniform and the measurements enable direct determination of vortex parameters such as pinning force constants {alpha}{sub p} and vortex viscosity {eta}. However, hysteresis loops are in disagreement with the thin-film Bean model, and instead are governed by the low-field scale H{sub i}, rather than by H{sub s}. Geometric barriers are insufficient to account for the hysteresis loops. {copyright} {ital 1997} {ital The American Physical Society}
- OSTI ID:
- 544955
- Journal Information:
- Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 18 Vol. 56; ISSN 0163-1829; ISSN PRBMDO
- Country of Publication:
- United States
- Language:
- English
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