Biaxially aligned buffer layers of cerium oxide, yttria stabilized zirconia, and their bilayers
- CSIRO Telecommunications and Industrial Physics, Lindfield NSW 2070 (Australia)
Biaxially aligned cerium oxide (CeO{sub 2}) and yttria stabilized zirconia (YSZ) films were deposited on Ni-based metal (Hastelloy C276) substrates held at room temperature using ion beam assisted (IBAD) magnetron deposition with the ion beam directed at 55{degree} to the normal of the film plane. In addition, we achieved, room-temperature epitaxial growth of CeO{sub 2} by bias sputtering to form biaxially aligned CeO{sub 2}/YSZ bilayers. The crystalline structure and in-plane orientation of films was investigated by x-ray diffraction techniques. Both the IBAD CeO{sub 2} and YSZ films, and the CeO{sub 2}/YSZ bilayers have a (111) pole in the ion beam direction. {copyright} {ital 1997 American Institute of Physics.}
- OSTI ID:
- 544338
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 21 Vol. 70; ISSN APPLAB; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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