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High resolution threshold and pulsed field ionization photoelectron spectroscopy using multi-bunch synchrotron radiation

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1147977· OSTI ID:543598
 [1]; ;  [2];  [3]
  1. Chemical Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
  2. Ames Laboratory, U.S. Department of Energy and Department of Chemistry, Iowa State University, Ames, Iowa 50011 (United States)
  3. Advanced Light Source and Accelerator and Fusion Research Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
We have demonstrated a resolution of 0.8 meV [full width at half-maximum (FWHM)] for threshold photoelectron measurements using a steradiancy-type zero kinetic energy photoelectron (ZEKE-PE) analyzer and the high resolution monochromatized vacuum ultraviolet (VUV) undulator synchrotron radiation of the chemical dynamics beamline at the advanced light source (ALS). Using this high resolution ZEKE-PE energy analyzer to filter prompt electrons and by employing a proper voltage pulsing scheme adapted to the timing structure of the ALS, we have achieved a resolution of 0.5 meV (FWHM) for pulsed field ionization photoelectron (PFI-PE) measurements with little contamination from prompt photoelectrons produced from direct photoionization and autoionizing processes. The experiment scheme presented here is generally applicable to PFI-PE studies using multi-bunch VUV synchrotron radiation at other synchrotron radiation facilities. {copyright} {ital 1997 American Institute of Physics.}
Research Organization:
Lawrence Berkeley National Laboratory
DOE Contract Number:
AC03-76SF00098; W-7405-ENG-82
OSTI ID:
543598
Journal Information:
Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 4 Vol. 68; ISSN RSINAK; ISSN 0034-6748
Country of Publication:
United States
Language:
English