A high resolution pulsed field ionization photoelectron study of O{sub 2} using third generation undulator synchrotron radiation
Journal Article
·
· Journal of Chemical Physics
- Chemical Sciences Division and Advanced Light Source, Accelerator and Fusion Research Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
- Ames Laboratory, United States Department of Energy
We have improved a newly developed experimental scheme for high resolution pulsed field ionization photoelectron (PFI-PE) studies [Hsu {ital et al.}, Rev. Sci. Instrum. (in press)] using the high resolution monochromatized multibunch undulator synchrotron source of the Chemical Dynamics Beamline at the Advanced Light Source. This improved scheme makes possible PFI-PE measurements with essentially no contamination by background electrons arising from direct photoionization and prompt autoionization processes. We present here a preliminary analysis of the rotationally resolved PFI-PE spectrum for O{sub 2} obtained at a resolution of 0.5 meV (full-width-at-half-maximum) in the photon energy range of 18.1{endash}19.4 eV, yielding accurate ionization energies for the transitions O{sub 2}{sup +}(b{sup 4}{Sigma}{sub g}{sup {minus}}, v{sup +}=0{endash}9, N{sup +}=1){l_arrow}O{sub 2}(X{sup 3}{Sigma}{sub g}{sup {minus}}, v=0, N=1). {copyright} {ital 1997 American Institute of Physics.}
- Research Organization:
- Lawrence Berkeley National Laboratory
- DOE Contract Number:
- AC03-76SF00098; W-7405-ENG-82
- OSTI ID:
- 496673
- Journal Information:
- Journal of Chemical Physics, Journal Name: Journal of Chemical Physics Journal Issue: 21 Vol. 106; ISSN JCPSA6; ISSN 0021-9606
- Country of Publication:
- United States
- Language:
- English
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