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A high resolution pulsed field ionization photoelectron study of O{sub 2} using third generation undulator synchrotron radiation

Journal Article · · Journal of Chemical Physics
DOI:https://doi.org/10.1063/1.473956· OSTI ID:496673
;  [1]; ; ; ;  [2]
  1. Chemical Sciences Division and Advanced Light Source, Accelerator and Fusion Research Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
  2. Ames Laboratory, United States Department of Energy
We have improved a newly developed experimental scheme for high resolution pulsed field ionization photoelectron (PFI-PE) studies [Hsu {ital et al.}, Rev. Sci. Instrum. (in press)] using the high resolution monochromatized multibunch undulator synchrotron source of the Chemical Dynamics Beamline at the Advanced Light Source. This improved scheme makes possible PFI-PE measurements with essentially no contamination by background electrons arising from direct photoionization and prompt autoionization processes. We present here a preliminary analysis of the rotationally resolved PFI-PE spectrum for O{sub 2} obtained at a resolution of 0.5 meV (full-width-at-half-maximum) in the photon energy range of 18.1{endash}19.4 eV, yielding accurate ionization energies for the transitions O{sub 2}{sup +}(b{sup 4}{Sigma}{sub g}{sup {minus}}, v{sup +}=0{endash}9, N{sup +}=1){l_arrow}O{sub 2}(X{sup 3}{Sigma}{sub g}{sup {minus}}, v=0, N=1). {copyright} {ital 1997 American Institute of Physics.}
Research Organization:
Lawrence Berkeley National Laboratory
DOE Contract Number:
AC03-76SF00098; W-7405-ENG-82
OSTI ID:
496673
Journal Information:
Journal of Chemical Physics, Journal Name: Journal of Chemical Physics Journal Issue: 21 Vol. 106; ISSN JCPSA6; ISSN 0021-9606
Country of Publication:
United States
Language:
English