Microprobe x-ray fluorescence with the use of point-focusing diffractors

Journal Article · Mon Sep 01 04:00:00 EDT 1997 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.119427· OSTI ID:542534

Chen, Z W; Wittry, D B ^[1]

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1. Department of Materials Science and Engineering, University of Southern California, Los Angeles, California 90089-0241 (United States)

A toroidal point-focusing mica crystal diffractor was used to focus monochromatic x rays from a microfocus x-ray source operated at 0.1 mA and 30 kV. The CuK{sub {alpha}} x-ray focal spot of 50{mu}m{times}85{mu}m had 1.6{times}10{sup 4}photons/s/{mu}m{sup 2}. Microprobe x-ray fluorescence (MXRF) spectra were recorded with a Si(Li) energy dispersive detector for bulk specimens of GaAs, Si, and Muscovite. Low background due to monochromatic excitation resulted in predicted detection limits as low as 2 ppm for a measurement time of 500 s. Laboratory MXRF systems based on point-focusing diffractors were shown to provide lower detection limits, larger working distance, and higher theoretical intensity than systems using capillary optics. {copyright} {ital 1997 American Institute of Physics.}

• OSTI ID: 542534
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 13 Vol. 71; ISSN 0003-6951; ISSN APPLAB
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
FOCUSING
GALLIUM ARSENIDES
KEV RANGE 10-100
MICROANALYSIS
MUSCOVITE
SILICON
X-RAY DIFFRACTION
X-RAY FLUORESCENCE ANALYSIS
X-RAY FLUORESCENCE ANALYZERS
X-RAY SOURCES